Wafer by Wafer Low Dose Rate Acceptance Testing (ELDRS)

Added on May 01, 2012

The low dose rate ionizing dose response of semiconductors has become a key issue in space applications. Intersil is addressing this changed market by introducing wafer by wafer low dose rate acceptance testing as a complement to current high dose rate acceptance testing.

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br-558.pdf (1.88 MB)
Jul 2016