Estimated Failure Rates For Class T Products

QML Class T devices are processed to a standard flow intended to meet the cost and shorter lead-time needs of large volume satellite manufacturers, while maintaining a high level of reliability.

Rad Hard Technology Technology Description Years in Production Part Family Estimated FIT Rates @55C 60%CI[1]
MGR_CMOS 7 um CMOS
Metal Gate
> 25 Years CD4XXXXB 0.5
MGCMOS-RH 10 um CMOS DI > 20 Years HS-3XX,HS-508A 3
HFSTDB HFHIB 4 um BiPolar > 15 Years HS-5104A,HS565A 6
SSAJI4RH 3 um CMOS > 13 Years HS-6617 16k PROM 5
SOS_LT 3 um CMOS-SOS > 12 Years HCS/HCTS 2
AVLSIR
AVLSIRF
1.25 um CMOS
1.25 um CMOS
> 5 Years
> 5 Years
26CX31,26CX32
HS-6664 64K PROM
30
SOS5
TSOS4
1.25 um CMOS
1.25 um CMOS
2 Years
4 Years
ACS/ACTS
ACS/ACTS
30
RH-SIGATE  4 um Si Gate DI CMOS 2 Years HS-1840, HS-139R 14

[1] FIT rates are estimated from calendar year 1997 CLASS V actuals by multiplying by 2