Automated Test Equipment (ATE) ICs
Intersil is a leading supplier of innovative, low power, high
density components for the design of next generation Automated
Test Equipment (ATE). With a proven track record of consistently
delivering the highest density, lowest power solutions available,
systems designed around Intersil products have a competitive
advantage in the ATE market space and are able to adapt
successfully to emerging trends and challenges while providing
ever increasing end user value. Intersil offers a wide variety of
solutions for the ATE market with variable levels of integration so
that we can serve the unique requirements of multiple end user
segments such as System on a Chip (SOC) Test, Memory Test,
Test During Burn-in (TDBI), In-Circuit Test (ICT) and beyond.
View Product Parametric Data
Featured Products
ISL55180: System on a Chip (SOC) 8-Channel DPS
ISL55180 is a highly integrated System-on-a-Chip (SOC) Device Under Test (DUT) power supply solution incorporating 8 independent DUT Power Supply (DPS) units.
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ISL55100A: Quad 18V Pin Electronics Driver/Window Comparator
The ISL55100A is a Quad pin driver and window comparator fabricated in a wide voltage CMOS process. It is designed specifically for Test During Burn In (TDBI) applications, where cost, functional density, and power are all at a premium. More »
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ISL55161: System on a Chip (SOC) Dual Channel 400MHz Pin Electronics/DAC/PMU
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New Products: ATE ICs
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ISL55163
SOC Dual Channel 400MHz Pin Electronics/DAC/PMU -
ISL55161
SOC Dual Channel 400MHz Pin Electronics/DAC/PMU -
ISL55162
SOC Dual Channel 300MHz Pin Electronics/DAC/PMU/Deskew -
ISL55164
SOC Dual Channel 133MHz Pin Electronics Solution -
TRITON
SOC Octal Wide Voltage PMU / Load -
SATURN
System on a Chip, Dual Channel wide Voltage Pin Electronics Solution
