Estimated Failure Rates For Class T Products
| Rad HardTechnology | Technology Description | Years inProduction | Part Family | Estimated Fit Rates @55C 60%CI[1] |
|---|---|---|---|---|
| MGR_CMOS | 7 um CMOS Metal Gate |
> 25 Years | CD4XXXXB | 0.5 |
| MGCMOS-RH | 10 um CMOS DI | > 20 Years | HS-3XX,HS-508A | 3 |
| HFSTDB HFHIB | 4 um BiPolar | > 15 Years | HS-5104A,HS565A | 6 |
| SSAJI4RH | 3 um CMOS | > 13 Years | HS-6617 16k PROM | 5 |
| SOS_LT | 3 um CMOS-SOS | > 12 Years | HCS/HCTS | 2 |
| AVLSIR AVLSIRF |
1.25 um CMOS 1.25 um CMOS |
> 5 Years > 5 Years |
26CX31,26CX32 HS-6664 64K PROM |
30 |
| SOS5 TSOS4 |
1.25 um CMOS 1.25 um CMOS |
2 Years 4 Years |
ACS/ACTS ACS/ACTS |
30 |
| RH-SIGATE | 4 um Si Gate DI CMOS | 2 Years | HS-1840, HS-139R | 14 |
[1] FIT rates are estimated from calendar year 1997 CLASS V actuals by multiplying by 2
